首页> 外国专利> METHOD AND APPARATUS FOR SEGMENTING PARTICLES OF ELECTRON MICROSCOPE IMAGE IN POROUS STRUCTURE

METHOD AND APPARATUS FOR SEGMENTING PARTICLES OF ELECTRON MICROSCOPE IMAGE IN POROUS STRUCTURE

机译:在多孔结构中细分电子显微图像的方法和装置

摘要

Disclosed are a method and apparatus for segmenting a particle of an electron microscope image in a porous structure. According to the present invention, the method comprises the following steps: receiving an image in a nanostructure, and estimating a boundary line by an adaptive threshold value; performing the sampling of the boundary line based on ray casting to estimate the boundary line of an actual particle on the estimated boundary line map; confirming whether the particle is detected or not; estimating circularity of the particles to select the best circular particle among the detected particles by using a predetermined equation; selecting the best circular particle among the particles by using the estimated circularity; accumulating the selected particles onto the boundary line of the boundary line map to update the map; and accumulating the selected particles onto the boundary line of the boundary line map to update a particle recognition map.;COPYRIGHT KIPO 2016
机译:公开了一种用于在多孔结构中分割电子显微镜图像的粒子的方法和设备。根据本发明,该方法包括以下步骤:接收纳米结构中的图像,并通过自适应阈值估计边界线;以及基于射线投射对边界线进行采样,以在估计的边界线图上估计实际粒子的边界线;确认是否检测到颗粒;通过使用预定方程估计颗粒的圆度以在检测到的颗粒中选择最佳的圆形颗粒;通过使用估计的圆度,在粒子中选择最佳的圆形粒子;将选择的粒子累积到边界线图的边界线上以更新该图;将选定的粒子累积到边界线图的边界线上以更新粒子识别图。; COPYRIGHT KIPO 2016

著录项

  • 公开/公告号KR20150111460A

    专利类型

  • 公开/公告日2015-10-06

    原文格式PDF

  • 申请/专利权人 INHA-INDUSTRY PARTNERSHIP INSTITUTE;

    申请/专利号KR20140034308

  • 发明设计人 LEE HYUN GYUKR;LEE SANG CHULKR;

    申请日2014-03-24

  • 分类号G06T7/00;H01J37/26;

  • 国家 KR

  • 入库时间 2022-08-21 14:59:08

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