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METHOD FOR OPERATING OPTICAL AXIS TESTING DEVICE FOR OPTICAL SYSTEM

机译:用于光学系统的光学轴测试设备的方法

摘要

Disclosed is a method for operating an optical axis testing device for an optical system. The present invention includes a step of placing a test subject; a step of transmitting a first optical signal mixed with multiple different wavelengths for testing an optical axis of the test subject; a step of receiving the first optical signal to convert the signal into a first discrete signal; a step of receiving a second optical signal, formed of at least part of the wavelengths included in the first optical signal, from the test subject by outputting the first optical signal to the test subject located in a progress path of the first optical signal in order to convert the second optical signal into a second discrete signal; and a step of determining whether the optical axis of the test subject is normal or not by using the first and second discrete signals delivered through separate paths.;COPYRIGHT KIPO 2015
机译:公开了一种用于操作光学系统的光轴测试装置的方法。本发明包括放置测试对象的步骤。传输混合有多种不同波长的第一光信号以测试被测对象的光轴的步骤;接收第一光信号以将该信号转换为第一离散信号的步骤;通过按顺序将第一光信号输出到位于第一光信号的前进路径中的被测物,从被测物接收由第一光信号中包括的至少一部分波长的至少一部分形成的第二光信号的步骤。将第二光信号转换为第二离散信号;以及通过使用通过分开的路径传递的第一和第二离散信号来确定测试对象的光轴是否正常的步骤。COPYRIGHTKIPO 2015

著录项

  • 公开/公告号KR101483062B1

    专利类型

  • 公开/公告日2015-01-15

    原文格式PDF

  • 申请/专利权人 LIG NEX1 CO. LTD.;

    申请/专利号KR20140084502

  • 发明设计人 JUNG BO HEEKR;KIM DUCK LAEKR;

    申请日2014-07-07

  • 分类号G01M11/02;G01J1/00;G01J5/00;G02B26/08;G02B27/00;

  • 国家 KR

  • 入库时间 2022-08-21 14:58:49

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