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A method for the automatic recognition of defective pixels of a detector of an imaging by lighting system as well as corresponding by lighting system

机译:一种通过照明系统以及照明系统自动识别成像检测器的缺陷像素的方法

摘要

A method for the automatic recognition of defective pixels of a detector (4) of an imaging system (20 by lighting),the method comprising the steps of:Detecting a plurality of images (1; 2) by means of the detector (4),Generating a noise image (niD; Ni''D; NiB; Ni''B) from the images (1; 2), wherein a pixel value of the noise image (niD; Ni''D; NiB; Ni''B) as a function of corresponding pixel values of the plurality of images (1; 2) is determined, and wherein each pixel value of the noise image (niD; Ni''D; NiB; Ni''B) a measure for the noise within the pixel values of the corresponding pixels of the plurality of images (1; 2) represents,Determining a mean value of all pixel values of the noise image (niD; Ni''D; NiB; Ni''B),Determining an average deviation of all pixel values of the noise image (niD; Ni''D; NiB; Ni''B) of the mean value, andDetection of a pixel of the detector (4) as a defect pixel as a function of the corresponding pixel value within the noise image (niD; Ni''D; NiB; Ni''B), from the mean value of all of the pixel values and from the mean deviation of all pixel values.
机译:一种通过照明自动识别成像系统(20)的检测器(4)的缺陷像素的方法,该方法包括以下步骤:通过检测器(4)检测多个图像(1; 2)生成噪声图像(ni D ; Ni'' D ; Ni B ; Ni'' B )从图像(1; 2)中,其中噪声图像的像素值(ni D ; Ni'' D ; Ni B ;根据多个图像(1; 2)的相应像素值确定Ni'' B ),并且其中噪声图像(ni D ; Ni'' D ; Ni B ; Ni'' B )测量像素的相应像素的像素值内的噪声多个图像(1; 2)表示确定噪声图像(ni D ; Ni'' D ; Ni B ; Ni'' B ),确定噪声图像所有像素值的平均偏差(ni D ; N i'' D ; Ni B ;平均值的Ni'' B )和作为缺陷像素的检测器(4)的像素的检测与噪声图像(ni D < / Sub>; Ni'' D ; Ni B ; Ni'' B ),从所有像素值的平均值从所有像素值的平均偏差。

著录项

  • 公开/公告号DE102010019735B4

    专利类型

  • 公开/公告日2015-10-15

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20101019735

  • 发明设计人 CHRISTIAN SCHMIDGUNST;

    申请日2010-05-07

  • 分类号G03B42/02;G01N23/04;H04N5/325;

  • 国家 DE

  • 入库时间 2022-08-21 14:55:54

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