首页> 外国专利> Method and drawing apparatus for determining optimum irradiation amount of drawing electron beam

Method and drawing apparatus for determining optimum irradiation amount of drawing electron beam

机译:确定拉制电子束最佳照射量的方法和拉制装置

摘要

Stored energy is evaluated for each of segmented regions, and using the evaluated stored energy, an optimal irradiation amount for an electron beam is evaluated by a conjugate gradient method. The evaluated stored energy is used instead of calculating a determinant (Apk) in the procedure that includes calculation of the determinant (Apk) from among repeated calculation procedures that follow the conjugate gradient method and seek to answer a simultaneous linear equation (Ax=b) with a matrix (A) as a coefficient. Thus it is possible to evaluate the optimal irradiation amount for an electron beam with a high processing speed and a high degree of accuracy, and without expressly requiring the calculation of Apk, by managing the giant matrix (A) comprising numerous factors according to reduction of lines of circuitry in a circuit pattern.
机译:对于每个分割区域评估储能,并且使用评估的储能,通过共轭梯度法评估电子束的最佳照射量。在包括遵循共轭梯度法并试图回答联立线性方程式(Ax = b)的重复计算过程中,包括计算行列式(Apk)的过程中,使用评估的存储能量代替计算行列式(Apk)以矩阵(A)作为系数。因此,通过管理包含大量因素的巨型矩阵(A),根据其减少,可以以高处理速度和高精度来评估电子束的最佳照射量,而无需明确地计算Apk。电路图案中的电路线。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号