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Power cycle test equipment

机译:功率循环测试设备

摘要

PROBLEM TO BE SOLVED: To achieve sharp current rise in ON operation of a constant current control circuit and to surely suppress overshoot due to the sharp current rise in a power cycle testing apparatus configured by interposing the constant current control circuit between a DC power supply circuit and a power semiconductor (object to be tested) and capable of applying an ON/OFF operation command to the constant current control circuit in an output ON state of the DC power supply circuit.;SOLUTION: A DC power supply circuit 10 capable of setting a current value and a constant current control circuit 20 capable of setting a current value are connected in series between output terminals T1, T2 to which a power semiconductor 50 to be an object to be tested is to be connected. An ON/OFF operation command to the constant current control circuit 20 is applied by an output ON state of the DC power supply circuit 10. A current setting value in the constant current control circuit 20 is set to a level slightly higher than a current setting value in the DC power supply circuit 10.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:在通过在直流电源电路之间插入恒定电流控制电路而构成的功率循环测试装置中,为了在恒定电流控制电路的接通操作中实现急剧的电流上升,并可靠地抑制由于急剧的电流上升而引起的过冲。功率半导体(被检体),在直流电源电路的输出接通状态下,能够对恒流控制电路施加接通/断开动作指令。解决方案:能够进行设定的直流电源电路10在输出端子T1,T2之间串联连接有电流值和能够设定电流值的恒流控制电路20,在该输出端子T1,T2上连接有作为被检查对象的功率半导体50。通过DC电源电路10的输出ON状态向恒流控制电路20施加ON / OFF操作命令。将恒流控制电路20中的电流设定值设定为比电流设定稍高的电平。直流电源电路10中的值。;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP5891184B2

    专利类型

  • 公开/公告日2016-03-22

    原文格式PDF

  • 申请/专利权人 エスペック株式会社;

    申请/专利号JP20130005965

  • 发明设计人 日下 美智哉;

    申请日2013-01-17

  • 分类号H02M3/155;G05F1/56;

  • 国家 JP

  • 入库时间 2022-08-21 14:40:49

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