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Lifetime due to temperature history evaluation apparatus and tip temperature measuring device

机译:由于温度历史评估装置和尖端温度测量装置而产生的寿命

摘要

PROBLEM TO BE SOLVED: To provide a lifetime evaluation device with a temperature history capable of rationally determining the lifetime of a temperature sensor in an iron head temperature measurement device.;SOLUTION: A lifetime evaluation device includes: a temperature sensor 201; time measurement means (a timer 207) for measuring a lapsed time for the detection of temperature when the temperature sensor detects a fixed level or more temperature; evaluation value calculation means (an arithmetic part 202) for calculating an evaluation value to be greater as temperature is higher and a time is longer on the basis of both data of the temperature detected by the temperature sensor and the time measured by the time measurement means; integration means (the arithmetic part 202) for calculating an integration value of the evaluation value whenever the temperature sensor detects a fixed level or more temperature; storage means (a storage part 203) for storing by updating an integration value calculated by the integration means; and alarm means (the arithmetic part 202) for generating an alarm signal when the integration value of the evaluation value exceeds a predetermined lifetime value.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种具有温度历史的寿命评估装置,该温度历史能够合理地确定烙铁头温度测量装置中温度传感器的寿命。解决方案:寿命评估装置包括:温度传感器201;时间测量装置(定时器207),用于当温度传感器检测到固定温度或更高温度时,测量用于检测温度的经过时间;评估值计算装置(算术部件202),用于基于温度传感器检测到的温度数据和时间测量装置所测量的时间两者来计算温度越高且时间越长的评估值越大;积分装置(运算部202),当温度传感器检测到一定温度以上时,计算评价值的积分值。存储装置(存储部分203),用于通过更新由积分装置计算出的积分值来进行存储;警报装置(运算部202),当评价值的累计值超过预定的寿命值时产生警报信号。(COP)版权:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP5894805B2

    专利类型

  • 公开/公告日2016-03-30

    原文格式PDF

  • 申请/专利权人 太洋電機産業株式会社;

    申请/专利号JP20120007045

  • 发明设计人 吉原 史治;

    申请日2012-01-17

  • 分类号G01N17/00;G01N25/00;B23K1/00;B23K3/02;B23K101/42;

  • 国家 JP

  • 入库时间 2022-08-21 14:40:15

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