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Lifetime due to temperature history evaluation apparatus and tip temperature measuring device
Lifetime due to temperature history evaluation apparatus and tip temperature measuring device
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机译:由于温度历史评估装置和尖端温度测量装置而产生的寿命
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摘要
PROBLEM TO BE SOLVED: To provide a lifetime evaluation device with a temperature history capable of rationally determining the lifetime of a temperature sensor in an iron head temperature measurement device.;SOLUTION: A lifetime evaluation device includes: a temperature sensor 201; time measurement means (a timer 207) for measuring a lapsed time for the detection of temperature when the temperature sensor detects a fixed level or more temperature; evaluation value calculation means (an arithmetic part 202) for calculating an evaluation value to be greater as temperature is higher and a time is longer on the basis of both data of the temperature detected by the temperature sensor and the time measured by the time measurement means; integration means (the arithmetic part 202) for calculating an integration value of the evaluation value whenever the temperature sensor detects a fixed level or more temperature; storage means (a storage part 203) for storing by updating an integration value calculated by the integration means; and alarm means (the arithmetic part 202) for generating an alarm signal when the integration value of the evaluation value exceeds a predetermined lifetime value.;COPYRIGHT: (C)2013,JPO&INPIT
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