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METHOD AND SYSTEM FOR AUTOMATED DETECTION AND MEASUREMENT OF A TARGET STRUCTURE

机译:自动检测和测量目标结构的方法和系统

摘要

A system and method for imaging a subject are disclosed. A plurality of edge points corresponding to a set of candidate structures are determined in each image frame in a plurality of 3D image frames corresponding to a volume in the subject. A target structure is detected from the set of candidate structures by applying constrained shape fitting to the edge points in each image frame. A subgroup of image frames including the target structure is identified from the 3D frames. A subset of edge points corresponding to the target structure is determined in each of the subgroup of image frames. A plurality of 2D scan planes corresponding to the subset of edge points is determined, and ranked using a determined ranking function to identify a desired scan plane. A diagnostic parameter corresponding to the target structure is measured using a selected image frame that includes the desired scan plane.
机译:公开了一种用于对对象成像的系统和方法。在与对象中的体积相对应的多个3D图像帧中的每个图像帧中,确定与一组候选结构相对应的多个边缘点。通过对每个图像帧中的边缘点应用约束形状拟合,从候选结构集中检测目标结构。从3D帧中识别出包括目标结构的图像帧的子组。在图像帧的每个子组中确定对应于目标结构的边缘点的子集。确定与边缘点的子集相对应的多个2D扫描平面,并使用确定的排序功能对它们进行排序以识别期望的扫描平面。使用包括所需扫描平面的选定图像帧来测量与目标结构相对应的诊断参数。

著录项

  • 公开/公告号US2016081663A1

    专利类型

  • 公开/公告日2016-03-24

    原文格式PDF

  • 申请/专利权人 GENERAL ELECTRIC COMPANY;

    申请/专利号US201414489497

  • 发明设计人 JIXU CHEN;KAJOLI BANERJEE KRISHNAN;

    申请日2014-09-18

  • 分类号A61B8/08;A61B5;A61B8;G06T7;

  • 国家 US

  • 入库时间 2022-08-21 14:36:09

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