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Circuit and Method for Comparator Offset Error Detection and Correction in an ADC

机译:ADC中比较器失调误差检测和校正的电路和方法

摘要

A method includes sampling an input voltage signal applied to an ADC, comparing the sampled input voltage signal with an output signal of a feedback DAC, and determining in a search logic block a digital code representation for the comparison result. The method may also include performing a calibration by: performing an additional cycle, wherein a last comparison carried out for determining a least significant bit of the digital code representation is repeated with a second comparator resolution mode different from a first comparator resolution mode, so obtaining an additional comparison; determining from a difference between results of the additional comparison and the last comparison a sign of a comparator offset error between the comparator resolution modes; and tuning, in accordance with a sign of the comparator offset error, a programmable capacitor connected at an input of the comparator, thereby inducing a voltage step to counteract the comparator offset error.
机译:一种方法包括:采样施加到ADC的输入电压信号;将采样的输入电压信号与反馈DAC的输出信号进行比较;以及在搜索逻辑块中确定用于比较结果的数字代码表示。该方法还可以包括通过以下步骤来执行校准:执行附加循环,其中以不同于第一比较器分辨率模式的第二比较器分辨率模式重复执行为确定数字代码表示的最低有效位而执行的最后比较,从而额外的比较;根据附加比较结果与最后比较结果之间的差异,确定比较器分辨率模式之间的比较器偏移误差的符号;根据比较器偏移误差的符号,对连接在比较器输入端的可编程电容器进行调谐,从而感应出电压阶跃,以抵消比较器偏移误差。

著录项

  • 公开/公告号US2016248435A1

    专利类型

  • 公开/公告日2016-08-25

    原文格式PDF

  • 申请/专利权人 STICHTING IMEC NEDERLAND;

    申请/专利号US201615048516

  • 发明设计人 PIETER HARPE;

    申请日2016-02-19

  • 分类号H03M1/10;H03M1/46;

  • 国家 US

  • 入库时间 2022-08-21 14:35:34

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