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PREDICTING CIRCUIT RELIABILITY AND YIELD USING NEURAL NETWORKS
PREDICTING CIRCUIT RELIABILITY AND YIELD USING NEURAL NETWORKS
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机译:使用神经网络预测电路可靠性和成品率
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摘要
A system and method for predicting a product characteristic are provided. The system includes a data acquisition module configured to acquire raw data associated with to-be predicted prediction information, a data conversion module configured to convert the raw data into computable normalized data, and a result prediction module configured to calculate a prediction result based on the normalized data and compare the prediction result with a predetermined standard value. The result prediction module includes a neural network prediction model configured to calculate the prediction result based on the normalized data. The prediction information may include reliability and/or yield to prevent major reliability or yield problems from occurring during manufacturing of semiconductor devices.
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