首页>
外国专利>
OPTIMAL TEST FLOW SCHEDULING WITHIN AUTOMATED TEST EQUIPMENT FOR MINIMIZED MEAN TIME TO DETECT FAILURE
OPTIMAL TEST FLOW SCHEDULING WITHIN AUTOMATED TEST EQUIPMENT FOR MINIMIZED MEAN TIME TO DETECT FAILURE
展开▼
机译:在自动测试设备中安排最佳测试流程,以最大程度地减少检测故障的平均时间
展开▼
页面导航
摘要
著录项
相似文献
摘要
The present invention describes a method and system for optimizing a test flow within each ATE (Automated Test Equipment) station. The test flow includes a plurality of test blocks. A test block includes a plurality of individual tests. A computing system schedule the test flow based one or more of: a test failure model, test block duration and a yield model. The failure model determines an order or sequence of the test blocks. There are at least two failure models: independent failure model and dependant failure model. The yield model describes whether a semiconductor chip is defective or not. Upon completing the scheduling, the ATE station conducts tests according to the scheduled test flow. The present invention can also be applied to software testing.
展开▼