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STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATING OF EXCITATION BEAM AND SYNCHRONOUS DETECTION OF FLUORESCENCE EMISSION
STIMULATED EMISSION-DEPLETION (STED) MICROSCOPY BASED ON TIME GATING OF EXCITATION BEAM AND SYNCHRONOUS DETECTION OF FLUORESCENCE EMISSION
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机译:基于激发束时间门控和荧光发射同步检测的受激发射损耗(STED)显微镜
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摘要
Method of optical microscopy by scanning a sample containing an excitable species, the method comprising:;directing a first and a second light beam onto respective, partially overlapped areas of the sample, wherein the first light beam is provided for exciting members of the excitable species, and the second light beam is provided for reducing the number of excited members;;detecting an optical signal coming from the sample, comprising a main component and a spurious component, during consecutive first and second time gates, the first time gate being provided for detecting the optical signal for a time interval during which the main component and the spurious component are both present, and the second time gate being provided for detecting the optical signal for a time interval during which the main component tends to or is zero;;processing the detected optical signal to separate its main component.
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