首页> 外国专利> SUBSTRATE HEAT TREATMENT APPARATUS, SUBSTRATE HEAT TREATMENT METHOD, STORAGE MEDIUM AND HEAT-TREATMENT-CONDITION DETECTING APPARATUS

SUBSTRATE HEAT TREATMENT APPARATUS, SUBSTRATE HEAT TREATMENT METHOD, STORAGE MEDIUM AND HEAT-TREATMENT-CONDITION DETECTING APPARATUS

机译:基体热处理设备,基体热处理方法,存储介质和热处理状态检测设备

摘要

A substrate heat treatment apparatus includes: a placement unit on which a substrate is placed; a heat treatment unit for heating or cooling the substrate on the placement unit; a plurality of temperature sensors positioned correspondingly to a plurality of locations of the substrate on the placement unit; and a control unit. The control unit is configured to control the heat treatment unit based on temperatures detected by the temperature sensors, to calculate a position of a thermal center of gravity of the substrate based on the temperatures detected by the temperature sensors, and to detect heat treatment condition of the substrate based on the position of the thermal center of gravity.
机译:一种基板热处理设备,包括:放置单元,其上放置基板;热处理单元,用于加热或冷却放置单元上的基板;多个温度传感器,其对应于所述基板在所述放置单元上的多个位置定位;和一个控制单元。控制单元被配置为基于由温度传感器检测到的温度来控制热处理单元,基于由温度传感器检测到的温度来计算基板的热重心的位置,并检测基板的热处理条件。根据热重心的位置确定基材。

著录项

  • 公开/公告号US2016093519A1

    专利类型

  • 公开/公告日2016-03-31

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号US201514861135

  • 发明设计人 KOUDAI HIGASHI;SHINICHIRO MISAKA;

    申请日2015-09-22

  • 分类号H01L21/67;H05B3;H05B3/20;

  • 国家 US

  • 入库时间 2022-08-21 14:33:40

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号