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Energy dispersive X-ray analyzer and method for energy dispersive X-ray analysis

机译:能量色散X射线分析仪和能量色散X射线分析方法

摘要

An energy dispersive X-ray analyzer is attached to a scanning electron microscope and includes: a SEM controller; a detector; an EDS controller; and a data processor. The data processor generates first and second X-ray mapping image respectively when the SEM controller controls the scanning electron microscope to irradiate the sample with an electron beam under first and second acceleration voltage conditions. The data processor corrects the first X-ray mapping image and the second X-ray mapping image into images that are independent of acceleration voltage condition based on a measurement intensity variation ratio of the X-ray when changed from the first acceleration voltage condition to the second acceleration voltage condition, and controls the display unit to display a difference image between the corrected first X-ray mapping image and the corrected second X-ray mapping image.
机译:能量色散X射线分析仪安装在扫描电子显微镜上,包括:SEM控制器;探测器EDS控制器;和一个数据处理器。当SEM控制器控制扫描电子显微镜在第一和第二加速电压条件下用电子束照射样品时,数据处理器分别生成第一和第二X射线映射图像。数据处理器基于当从第一加速电压条件改变为第一加速电压条件到第二加速器条件改变时的X射线的测量强度变化率,将第一X射线映射图像和第二X射线映射图像校正为与加速电压条件无关的图像。在第二加速电压条件下,控制显示单元以显示校正后的第一X射线映射图像和校正后的第二X射线映射图像之间的差异图像。

著录项

  • 公开/公告号US9349572B2

    专利类型

  • 公开/公告日2016-05-24

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECH SCIENCE CORPORATION;

    申请/专利号US201514664423

  • 发明设计人 YUTAKA IKKU;

    申请日2015-03-20

  • 分类号H01J37/26;H01J37/28;

  • 国家 US

  • 入库时间 2022-08-21 14:30:24

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