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Soft dark bit masking with integrated load modulation and burn-in induced destabilization for physically unclonable function keys
Soft dark bit masking with integrated load modulation and burn-in induced destabilization for physically unclonable function keys
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机译:带有集成负载调制和老化诱发的不稳定功能的软暗比特掩蔽功能,用于物理上不可克隆的功能键
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摘要
Embodiments of an invention for soft dark bit masking are disclosed. In one embodiment, an apparatus includes a basic physically unclonable function (PUF) cell, a load, and a masking circuit. The load is selectively connectable to the basic PUF cell to determine whether the basic PUF cell is unstable. The masking circuit is to mask the output of the basic PUF cell if the basic PUF cell is determined to be unstable. Embodiments of the invention also include mechanisms to reinforce the stability of stable cells, while further destabilizing unstable cells.
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