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Methods, systems, and articles of manufacture for analyzing a multi-fabric electronic design and displaying analysis results for the multi-fabric electronic design spanning and displaying simulation results across multiple design fabrics

机译:用于分析多结构电子设计并显示跨多结构电子设计的分析结果的方法,系统和制品,该结果跨越并显示跨多个设计结构的仿真结果

摘要

Disclosed are techniques to analyze multi-fabric designs. These techniques generate a cross-fabric analysis model by at least identifying first design data in a first design fabric of a multi-fabric electronic design using a first session of a first electronic design automation (EDA) tool, update the cross-fabric simulation model by at least identifying second design data in a second design fabric using a second session of a second EDA tool, and determine analysis results for the multi-fabric electronic design using at least the cross-fabric simulation model. Analysis results may be determined using parasitic, electrical, or performance information. Various EDA tools access their respective native design data in their respective domains or design fabrics and have no access to or visibility of non-native design data while these techniques automatically cross the boundaries between multiple design fabrics to accomplish the tasks of analyzing multi-fabric electronic designs or displaying analysis results therefor.
机译:公开了用于分析多结构设计的技术。这些技术通过使用第一电子设计自动化(EDA)工具的第一会话至少识别多结构电子设计的第一设计结构中的第一设计数据来生成跨结构分析模型,并更新跨结构仿真模型通过使用第二EDA工具的第二会话至少识别第二设计结构中的第二设计数据,并至少使用跨织物仿真模型来确定多织物电子设计的分析结果。可以使用寄生,电气或性能信息确定分析结果。各种EDA工具在其各自的域或设计结构中访问其各自的本机设计数据,并且无法访问或查看非本机设计数据,而这些技术会自动跨越多个设计结构之间的边界以完成分析多结构电子产品的任务。设计或显示分析结果。

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