首页> 外国专利> Methods and apparatus for measuring the thickness of a deposit of material on an internal wall of a structure, and to determine the stiffness of a material deposited on an internal wall of a estrtutra

Methods and apparatus for measuring the thickness of a deposit of material on an internal wall of a structure, and to determine the stiffness of a material deposited on an internal wall of a estrtutra

机译:用于测量结构的内壁上的材料沉积的厚度并确定沉积在雌蕊的内壁上的材料的刚度的方法和设备

摘要

A method of measuring the thickness of any deposit of material (28) on an inner wall (12) of a structure (14). The method comprises: (a) causing vibrations in the structure; (b) detecting said vibrations in the structure; (c) determining a resonance frequency of the structure based on the detected vibrations; and (d) determining the thickness of any deposit of material on the inner wall of the structure based on the determined resonance frequency.
机译:一种测量结构(14)的内壁(12)上任何材料沉积物(28)厚度的方法。该方法包括:(a)在结构中引起振动; (b)检测建筑物中的所述振动; (c)基于所检测到的振动来确定所述结构的共振频率; (d)基于所确定的共振频率,确定在结构的内壁上的任何材料沉积的厚度。

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