首页> 外国专利> Automatic avalanche photodiode bias setting system based on unity-gain noise measurement

Automatic avalanche photodiode bias setting system based on unity-gain noise measurement

机译:基于单位增益噪声测量的雪崩光电二极管偏置自动设置系统

摘要

A system (40) for setting the bias of a device (12). The novel bias setting system (40) includes a first system (50, 70) for determining a ratio between noise at an operating gain of the device (12) and noise at a reference gain of the device (12), and a second system (90) for adjusting the bias until that ratio is equal to a predetermined factor Z. The reference gain is the unity gain or reach-through gain of the device (12). In an illustrative embodiment, the first system (50, 70) is adapted to measure the noise at operating gain by determining an operating gain threshold, and measure the noise at the reference gain by determining a reference gain threshold. The second system (90) then adjusts the bias until the ratio of the operating gain threshold to the reference gain threshold is equal to the predetermined factor Z.
机译:用于设置装置(12)的偏压的系统(40)。新颖的偏置设置系统(40)包括:第一系统(50、70),其用于确定设备(12)的操作增益处的噪声与设备(12)的参考增益处的噪声之间的比率。 (90)用于调整偏置直到该比率等于预定因子Z。基准增益是设备(12)的单位增益或直通增益。在说明性实施例中,第一系统(50、70)适于通过确定操作增益阈值来测量操作增益下的噪声,并且通过确定参考增益阈值来测量参考增益下的噪声。然后,第二系统(90)调节偏置,直到工作增益阈值与参考增益阈值之比等于预定因子Z。

著录项

  • 公开/公告号IL220418A

    专利类型

  • 公开/公告日2016-04-21

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号IL20120220418

  • 发明设计人

    申请日2012-06-14

  • 分类号H01Lnull/null;

  • 国家 IL

  • 入库时间 2022-08-21 14:26:03

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