AN ANALOG BLOCK AND TEST BLOCKS FOR TESTING THEREOF

摘要

An apparatus relating generally to a system on chip (200) is disclosed. In this apparatus the system on chip (200) has at least one analog block (201) an input/output interface (221) a data test block (209) and a processing unit (230). The processing unit (230) is coupled to the input/output interface (221) to control access to the at least one analog block (201). The data test block (209) is coupled to the at least one analog block (201) through the input/output interface (221). The processing unit (230) is c oupled to the data test block (209) and configured to execute test code having at least one test pattern. The data test block (209) under control of the test code executed by the processing unit (230) is configured to test the at least one analog block (201) with the test pattern.