首页> 外国专利> DETECTION AND CORRECTION OF A LOSS OF CALIBRATION OF MICROBOLOMETER THERMAL IMAGING RADIOMETERS

DETECTION AND CORRECTION OF A LOSS OF CALIBRATION OF MICROBOLOMETER THERMAL IMAGING RADIOMETERS

机译:检测和校正微剂量计热成像辐射计的校准损失

摘要

A method for detecting a loss of calibration of a thermal imaging radiometer including an array of imaging microbolometers and a gauge microbolometer is provided. The detection method includes applying a first and a second electrical stimulation to the gauge microbolometer to bring it to a first and a second predetermined temperature, followed by measuring an ohmic responsivity of the gauge microbolometer that is representative of a difference between the first and second electrical stimulations. The measured ohmic responsivity is compared with a reference ohmic responsivity, such that a loss of calibration is signaled whenever the measured and reference ohmic responsivities differ by more than a predetermined threshold. A correction method is also provided, including steps of the detection method, to yield a corrected voltage response function for each imaging microbolometer. Advantageously, the methods involve probing the electrical response of the gauge microbolometer without requiring thermoregulated blackbody calibrations sources.
机译:提供了一种用于检测热成像辐射计的校准损失的方法,该热成像辐射计包括成像微测辐射热计阵列和量规微测辐射热计。该检测方法包括对仪表微测辐射热计施加第一和第二电刺激,以使其达到第一和第二预定温度,然后测量代表该第一和第二电气测温计之间的差异的仪表微测辐射热计的欧姆响应。刺激。将测得的欧姆响应率与参考欧姆响应率进行比较,以使得每当测得的和参考欧姆响应率相差超过预定阈值时就发出校准损失的信号。还提供了一种校正方法,包括检测方法的步骤,以为每个成像微辐射热测量仪产生校正后的电压响应函数。有利地,该方法涉及探测量规微辐射热计的电响应,而不需要温度调节的黑体校准源。

著录项

  • 公开/公告号CA2777570C

    专利类型

  • 公开/公告日2016-07-19

    原文格式PDF

  • 申请/专利权人 INSTITUT NATIONAL DOPTIQUE;

    申请/专利号CA20122777570

  • 发明设计人 TREMBLAY BRUNO;LE NOC LOIC;

    申请日2012-05-16

  • 分类号G01J5/02;G01J5/24;

  • 国家 CA

  • 入库时间 2022-08-21 14:21:44

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