首页> 外国专利> DIE FAILURE TESTING INCLUDING FAULT SIMULATION AND TEST OF ERROR RECOVERY MECHANISM

DIE FAILURE TESTING INCLUDING FAULT SIMULATION AND TEST OF ERROR RECOVERY MECHANISM

机译:模具故障测试,包括故障模拟和错误恢复机制的测试

摘要

The disclosed method includes, at a storage controller of a storage system, receiving host instructions to modify configuration settings corresponding to a first memory portion of a plurality of memory portions. The method includes, in response to receiving the host instructions to modify the configuration settings, identifying the first memory portion from the host instructions and modifying the configuration settings corresponding to the first memory portion, in accordance with the host instructions. The method includes, after modifying the configuration settings corresponding to the first memory portion, sending one or more commands to perform memory operations having one or more physical addresses corresponding to the first memory portion and receiving a failure notification indicating failed performance of at least a first memory operation of the one or more memory operations. The method includes, in response to receiving the failure notification, executing one or more error recovery mechanisms.
机译:所公开的方法包括在存储系统的存储控制器处接收主机指令,以修改与多个存储部分中的第一存储部分相对应的配置设置。该方法包括:响应于接收到主机指令以修改配置设置,根据主机指令从主机指令中识别第一存储器部分并修改与第一存储器部分相对应的配置设置。该方法包括,在修改与第一存储器部分相对应的配置设置之后,发送一个或多个命令以执行具有与第一存储器部分相对应的一个或多个物理地址的存储器操作,并接收指示至少第一存储器部分的失败性能的失败通知。一个或多个内存操作的内存操作。该方法包括响应于接收到故障通知,执行一种或多种错误恢复机制。

著录项

  • 公开/公告号WO2016010822A1

    专利类型

  • 公开/公告日2016-01-21

    原文格式PDF

  • 申请/专利权人 SANDISK ENTERPRISE IP LLC;

    申请/专利号WO2015US39789

  • 发明设计人 CREASMAN SCOTT;HIGGINS JAMES M.;

    申请日2015-07-09

  • 分类号G11C29/02;

  • 国家 WO

  • 入库时间 2022-08-21 14:19:24

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