首页> 外国专利> METHOD OF INSPECTING LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING LIGHT SOURCE MODULE, AND APPARATUS TO INSPECT LIGHT SOURCE MODULE

METHOD OF INSPECTING LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING LIGHT SOURCE MODULE, AND APPARATUS TO INSPECT LIGHT SOURCE MODULE

机译:检查光源模块是否有缺陷的方法,制造光源模块的方法以及检查光源模块的装置

摘要

According to an embodiment of the present invention, a method to inspect a light source module for defects comprises preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device, and the lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from a center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred.;COPYRIGHT KIPO 2016
机译:根据本发明的实施例,一种检查光源模块的缺陷的方法包括:准备板,在板上安装发光器件和覆盖发光器件的透镜。电流施加到发光器件以打开发光器件,并且在发光器件打开的情况下对透镜成像。基于所获得的图像,计算表示来自透镜中心的发光分布的对称性的中心对称性,并且将计算出的中心对称性与参考值进行比较,以确定是否发生了不对称的发光分布。; COPYRIGHT KIPO 2016

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