IMPLEMENTING EDIT AND UPDATE FUNCTIONALITY WITHIN A DEVELOPMENT ENVIRONMENT USED TO COMPILE TEST PLANS FOR AUTOMATED SEMICONDUCTOR DEVICE TESTING

摘要

how to debug the test procedure are disclosed for automated device testing. The method includes that saves state information for one and test plan for receiving a command to update the at least one modified test procedure modified in the first debugging session, the above state information on the breakpoint entry position including the information and, above revised test procedure is invoked within the scope of the test plan. The method involves the unloading of the test procedure is modified to defer the execution of the above, and the above test plan subsequently. It also includes using the above compiled file after it, and to compile the above modified test procedures in order to produce a compiled file to re-load the above test procedure in the above test plan. Lastly, it involves the interruption of the above execution at the breakpoint corresponding to the upper breakpoint entry positions in one and the above second debugging session to resume the execution of the above modified test procedure in the second debug session. ;