首页> 外国专利> HIGH NEGATIVE ZETA POTENTIAL POLYHEDRAL SILSESQUIOXANE COMPOSITION AND METHOD FOR DAMAGE FREE SEMICONDUCTOR WET CLEAN

HIGH NEGATIVE ZETA POTENTIAL POLYHEDRAL SILSESQUIOXANE COMPOSITION AND METHOD FOR DAMAGE FREE SEMICONDUCTOR WET CLEAN

机译:高负电性Zeta电位多面体倍半硅氧烷组合物和无损伤半导体湿法清洁方法

摘要

the present invention, (a) one or more metal ion-free base and ( b) a water-soluble metal ion-free polyhedral silsesquioxane and, (c) an oxidizing agent and, (d) metal ions - relates to a composition for removing particulate from comprising a glass of water, an integrated circuit substrate, (A), (b), (c) and to a composition obtained by combining components including (D). On the surface of the present invention it is also an integrated circuit device, (a), (b), (c) and (d) applying a composition containing, or, (a), (b), (c) and (d) by combining components comprising a step of applying the obtained composition, to a method for removing particulate matter from the surface of the integrated circuit device. ;
机译:本发明,(a)一种或多种无金属离子的碱和(b)无水溶性金属离子的多面体倍半硅氧烷,(c)氧化剂,和(d)金属离子-涉及用于从包括水的玻璃,集成电路基板,(A),(b),(c)中除去颗粒,并且除去通过组合包括(D)的组分而获得的组合物。在本发明的表面上,它也是一种集成电路器件,(a),(b),(c)和(d)施加包含或(a),(b),(c)和( d)通过将包括施加所得组合物的步骤的成分组合到从集成电路器件的表面去除颗粒物的方法中。 ;

著录项

  • 公开/公告号KR101569338B1

    专利类型

  • 公开/公告日2015-11-17

    原文格式PDF

  • 申请/专利权人 사켐인코포레이티드;

    申请/专利号KR20107010520

  • 发明设计人 하오 지안준;

    申请日2008-11-12

  • 分类号C11D11/00;C11D7/14;C11D7/22;H01L21/306;

  • 国家 KR

  • 入库时间 2022-08-21 14:15:34

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