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DISCRETE COMPONENT BACKWARD TRACEABILITY AND SEMICONDUCTOR DEVICE FORWARD TRACEABILITY

机译:离散分量后向可跟踪性和半导体器件向前可跟踪性

摘要

The system for providing a reverse and forward traceability is initiated by the methodology to identify the individual device (die, substrate and / or passive) contained in the semiconductor device. This technology is further for marking a semiconductor device with a unique identifier that enables the generation of a unique identifier and the individual elements in the semiconductor device and the device in the production of semiconductor devices to be tracked and traced through each process and test system It included.
机译:提供反向和正向可追溯性的系统由该方法启动,以识别半导体器件中包含的各个器件(芯片,衬底和/或无源器件)。该技术还用于用唯一标识符标记半导体器件,该标识符使得能够在每个过程和测试系统中跟踪和追溯唯一标识符的生成以及半导体器件中的各个元素以及半导体器件生产中的器件。包括在内。

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