DISCRETE COMPONENT BACKWARD TRACEABILITY AND SEMICONDUCTOR DEVICE FORWARD TRACEABILITY
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机译:离散分量后向可跟踪性和半导体器件向前可跟踪性
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摘要
The system for providing a reverse and forward traceability is initiated by the methodology to identify the individual device (die, substrate and / or passive) contained in the semiconductor device. This technology is further for marking a semiconductor device with a unique identifier that enables the generation of a unique identifier and the individual elements in the semiconductor device and the device in the production of semiconductor devices to be tracked and traced through each process and test system It included.
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