PROBER TO DETECT COPPER ION AND METHOD OF DETECTING COPPER ION USING SAME

摘要

A prober to detect a copper ion comprises: a semiconductor quantum dot of a core-shell structure having a concentration of 5.6-11.2 nM, and modified by CTAB; a thiosulfate having a concentration of 0.1-10 mM, and adhered to a surface of the semiconductor quantum dot; and the remainder consisting of a solvent. A purpose of the present invention is to provide the prober to detect the copper ion having improved stability and selectivity.;COPYRIGHT KIPO 2016