首页> 外国专利> THERMOGRAPHY-BASED METHOD FOR DETECTING DEFECTS IN SEALS COMPRISING CONDUCTIVE INNER-SEALS

THERMOGRAPHY-BASED METHOD FOR DETECTING DEFECTS IN SEALS COMPRISING CONDUCTIVE INNER-SEALS

机译:基于热成像的密封内导电缺陷检测方法

摘要

The present disclosure provides a method for detecting hot sealing defects in a container while it is being conveyed along a process line. The method is particularly suitable for vessels covered with cap liner and sealed with inner seal. The method uses a high frequency train that generates an eddy current in the inner seal (e.g., by a high frequency thermal induction unit), thereafter being sensed by an IR imager of radiation emitted from the conductive inner seal, The sensed IR image data is generated. The sensing may include: (i) a time window of a sensing session between 50 msec and 300 msec while the container is being carried through the FOV; And (ii) a detection range of a wavelength spectral region of 2 [mu] m to 6 [mu] m; As shown in FIG. The IR data is then processed to produce output data indicative of the presence or absence of at least one defect in the sealing of the container by the inner seal.
机译:本公开提供了一种用于在沿生产线输送容器时检测容器中的热密封缺陷的方法。该方法特别适用于盖有帽衬并用内部密封件密封的容器。该方法使用高频列,该高频列在内部密封件中产生涡流(例如,通过高频热感应单元),然后由从导电内部密封件发出的辐射的IR成像器进行感测。产生。感测可以包括:(i)在容器被运送通过FOV时在50毫秒和300毫秒之间的感测会话的时间窗口;以及(ii)波长范围为2μm至6μm的检测范围;如图1所示。然后处理IR数据以产生输出数据,该输出数据指示通过内部密封件在容器的密封中是否存在至少一个缺陷。

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