首页> 外国专利> CORRECTION METHOD OF ACCELERATION VOLTAGE DRIFT, DRIFT CORRECTION MEHTOD OF CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM LITHOGRAPHY APPARATUS

CORRECTION METHOD OF ACCELERATION VOLTAGE DRIFT, DRIFT CORRECTION MEHTOD OF CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM LITHOGRAPHY APPARATUS

机译:加速电压漂移的校正方法,带电粒子束的漂移校正方法及带电粒子束光刻技术

摘要

According to one aspect of the present invention, a correction method of an acceleration voltage drift comprises: a step of adjusting a focal point of a charged particle beam by a first adjustment value and measuring a second adjustment value when the focal point of the charged particle beam is adjusted after a pre-determined time has passed; a step of calculating a deviation amount of the first and second adjustment values; a step of calculating a corrected value of an acceleration voltage applied to a beam source emitting the charged particle beam corresponding to the deviation amount by using a correlation stored in a storage device; and a step of correcting the acceleration voltage applied to the beam source by using the corrected value. According to the present invention, an adjustment item is substantially reduced and throughput degradation may be restrained.;COPYRIGHT KIPO 2016
机译:根据本发明的一个方面,一种加速电压漂移的校正方法包括:通过第一调节值调节带电粒子束的焦点并在带电粒子的焦点时测量第二调节值的步骤。在预定时间过去之后调整光束;计算第一和第二调整值的偏差量的步骤;通过使用存储在存储装置中的相关性来计算施加到发射与偏离量相对应的带电粒子束的束源的加速电压的校正值的步骤;通过校正后的值校正施加在光束源上的加速电压的步骤。根据本发明,大大减少了调整项并且可以抑制吞吐量的降低。; COPYRIGHT KIPO 2016

著录项

  • 公开/公告号KR20160038779A

    专利类型

  • 公开/公告日2016-04-07

    原文格式PDF

  • 申请/专利权人 NUFLARE TECHNOLOGY INC.;

    申请/专利号KR20150134577

  • 发明设计人 MIZOGUCHI HIRONORIJP;

    申请日2015-09-23

  • 分类号H01L21/027;G03F1/20;G03F1/70;G03F7/20;

  • 国家 KR

  • 入库时间 2022-08-21 14:14:42

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