首页> 外国专利> - - SEMICONDUCTOR DEVICE HAVING VERTICAL CHARGE-COMPENSATED STRUCTURE AND SUB-SURFACE CONNECTING LAYER AND METHOD

- - SEMICONDUCTOR DEVICE HAVING VERTICAL CHARGE-COMPENSATED STRUCTURE AND SUB-SURFACE CONNECTING LAYER AND METHOD

机译:具有垂直电荷补偿结构和子表面连接层的半导体装置和方法

摘要

In one embodiment, a semiconductor device is formed having vertical local charge-compensation trenches, trench control regions, and surface-underlying doping layers. The vertical local charge-compensating trenches comprise at least a pair of opposite conductivity type semiconductor layers. The trench control regions are configured to provide a substantially vertical channel region that electrically couples the source regions to the surface-underlying doping layers. The surface-underlying doping layers are further configured to electrically connect the drain end of the channel to the vertical local charge compensation trenches. The body regions are configured to separate the surface-underlying doping layers from the surface of the device. ; Vertical local charge-compensating trench, trench control region, surface-down doping layer, vertical channel region
机译:在一个实施例中,形成一种具有垂直局部电荷补偿沟槽,沟槽控制区和下面的掺杂层的半导体器件。垂直局部电荷补偿沟槽包括至少一对相对的导电类型的半导体层。沟槽控制区被配置为提供基本垂直的沟道区,该沟道区将源极区电耦合至表面之下的掺杂层。位于表面下方的掺杂层还被配置为将沟道的漏极端电连接到垂直局部电荷补偿沟槽。主体区域被配置为将表面下面的掺杂层与器件的表面分开。 ;垂直局部电荷补偿沟槽,沟槽控制区,表面向下掺杂层,垂直沟道区

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