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Method for Controlling Operation of Evaporation Source to Improve Uniformity of Deposition Thin Film

机译:控制蒸发源运行以提高沉积薄膜均匀性的方法

摘要

The present invention relates to a method for controlling the operation of an evaporation source for improving the uniformity of a deposited thin film, including a plurality of crucibles in which different evaporation materials are accommodated, a plurality of distribution tubes for spraying respective evaporation materials from the crucibles, And a heating means for heating the evaporation material, the method comprising the steps of: (a) controlling the flow rate of the evaporation material in the evaporation source Heating the nozzle unit; (b) heating the heating unit to evaporate the evaporation materials in the plurality of crucibles, respectively; and (c) if the raw material stored in the crucible is consumed for a predetermined period of time, (D) increasing or decreasing the rate of any deposition material of the deposition material, If yaw is that by including the steps for raising or lowering the crucible to form a deposited film more uniform and improve the quality of the device, can increase the yield of the product effect thereto.
机译:控制蒸发源的操作的方法技术领域本发明涉及一种控制蒸发源的操作的方法,该方法用于改善沉积薄膜的均匀性,该方法包括:多个坩埚,其中容纳有不同的蒸发材料;多个分配管,用于从该容器中喷射各个蒸发材料。坩埚,以及用于加热蒸发材料的加热装置,该方法包括以下步骤:(a)控制蒸发源中蒸发材料的流速,加热喷嘴单元; (b)加热加热单元以分别蒸发多个坩埚中的蒸发材料; (c)如果储存在坩埚中的原料消耗了预定的时间,(D)增加或减少沉积材料中任何沉积材料的速率,如果偏航则包括增加或降低步骤坩埚形成更均匀的沉积膜并提高装置的质量,可以提高产品产量,从而达到其效果。

著录项

  • 公开/公告号KR101650744B1

    专利类型

  • 公开/公告日2016-08-25

    原文格式PDF

  • 申请/专利权人 주식회사 선익시스템;

    申请/专利号KR20140192453

  • 发明设计人 박현식;김길원;

    申请日2014-12-29

  • 分类号H01L51/56;H01L21/203;

  • 国家 KR

  • 入库时间 2022-08-21 14:12:05

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