Testing device thermal load and test method, the thermal load

摘要

It is an object:The testing device thermal load of the present invention makes it possible, a large temperature differential between a surface and an interior of a sample to be produced, while a load is applied to the test piece.Solution:A testing device of thermal load (1) includes a load portion (2) a properly applied to a tubular lamp (10) a load in a direction of an axial line (o), whereby the tubular lamp (10) a hollow section, which extends along the axial line (o) extends; a cooling fluid supply section (3), which causes a cooling fluid through the hollow section (11) inflow; and an infrared image furnace (4), of the test piece (10) by means of a plurality of sources of infrared radiation (42), which are arranged, in order to the test piece (10) of an entire region in the circumferential direction to be wrapped around from heated.