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AUTOMATED MANUFACTURING METHOD FOR AN ELECTRONIC CIRCUIT ADAPTED FOR DETECTING OR HAVING TIME REDUNDANCY FAULTS, COMPUTER PROGRAM AND ELECTRONIC CIRCUIT THEREFOR
AUTOMATED MANUFACTURING METHOD FOR AN ELECTRONIC CIRCUIT ADAPTED FOR DETECTING OR HAVING TIME REDUNDANCY FAULTS, COMPUTER PROGRAM AND ELECTRONIC CIRCUIT THEREFOR
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机译:用于检测或具有时间冗余性故障的电子电路的自动制造方法,计算机程序和电子电路
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摘要
The method for automated manufacturing of an electronic circuit tolerant to faults by temporal redundancy of maximum order N, comprising a step implemented by computer, according to which every memory cell of the circuit is replaced by a memory block (40) comprising a chain of memory cells in series, and a selection block which, in a temporal redundancy mode of order n1, n1∈[1,N], selects as output data of the memory block the majority content of n1 cells of the block, and can furthermore deliver a fault signal if the contents of the n1 cells differ. Said method is characterized in that the inserted memory blocks allow a dynamic switching from a temporal redundancy mode of order n1 to any other mode of order n2. Said method for N=2, in association with a mechanism for recording with roll-back, allows an error with only a double redundancy instead of a triple redundancy.
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