首页> 外国专利> LIGHT PENETRATION DEPTH EVALUATION METHOD, PERFORMANCE TEST METHOD USING EVALUATION METHOD, AND OPTICAL TOMOGRAPHY APPARATUS

LIGHT PENETRATION DEPTH EVALUATION METHOD, PERFORMANCE TEST METHOD USING EVALUATION METHOD, AND OPTICAL TOMOGRAPHY APPARATUS

机译:光穿透深度评估方法,使用评估方法的性能测试方法以及光学层析成像设备

摘要

There are provided a light penetration depth evaluation method capable of evaluating the penetration depth of ultraviolet light for a measurement target in a non-destructive and non-invasive manner, a performance test method using the evaluation method, and an optical tomography apparatus using the evaluation method. Using an optical tomography method of splitting low coherent light (L 0 ) into sample light (L 1 ) and reference light (L 2 ), emitting the sample light (L 1 ) to a measurement target (S) in a line shape, generating interference light (L 4 ) by superimposing reflected light (L 3 ) from the measurement target (S) due to emission of the sample light (L 1 ) and the reference light (L 2 ) on each other, and acquiring a two-dimensional spectroscopic tomographic image of the measurement target (S) by spectroscopically detecting the interference light (L 4 ) and performing frequency analysis, an arbitrary wavelength region in an ultraviolet region is cut out from low coherent light including a wavelength region from an ultraviolet region to a visible region and the arbitrary wavelength region is shaped into a spectrum having an arbitrary wavelength width, the two-dimensional spectroscopic tomographic image is acquired as using the low coherent light (L 0 ), and the penetration depth of the sample light for the measurement target is evaluated based on the two-dimensional spectroscopic tomographic image.
机译:提供一种能够以非破坏性且非侵入性的方式评估测量对象的紫外线的穿透深度的光穿透深度评估方法,使用该评估方法的性能测试方法以及使用该评估方法的光学层析成像设备方法。使用光学层析成像方法,将低相干光(L 0)分为样品光(L 1)和参考光(L 2),将样品光(L 1)呈线形发射到测量目标(S),生成通过将由于样品光(L 1)和参考光(L 2)的发射而产生的来自测量目标(S)的反射光(L 3)彼此叠加,并获得二维干涉光(L 4)通过分光检测干涉光(L 4)并进行频率分析,来获得测量目标(S)的分光层析图像,从低相干光中切出紫外光区域中的任意波长区域,该低相干光包括从紫外光区域到紫外光区域的波长区域。将可见光区域和任意波长区域成形为具有任意波长宽度的光谱,使用低相干光(L 0)获取二维光谱层析图像,并通过sa的穿透深度基于二维光谱层析图像,评估用于测量目标的大量光。

著录项

  • 公开/公告号EP3213690A4

    专利类型

  • 公开/公告日2017-11-08

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORPORATION;

    申请/专利号EP20150855630

  • 发明设计人 HIRAYAMA HEIJIRO;NAKAMURA SOHICHIRO;

    申请日2015-10-22

  • 分类号A61B5;

  • 国家 EP

  • 入库时间 2022-08-21 14:06:13

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