首页> 外国专利> THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM, PROGRAM, COMPUTER-READABLE STORAGE MEDIUM, AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD

THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT SYSTEM, PROGRAM, COMPUTER-READABLE STORAGE MEDIUM, AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD

机译:三维形状测量装置,三维形状测量系统,程序,计算机可读存储介质和三维形状测量方法

摘要

The 3D shape of a measurement object is measured accurately without using an encoder or other devices. A three-dimensional shape measurement device (10) includes a mark search unit (104) that calculates, using a search mark (40), a coordinate of a part of a surface of a measurement object (70) including an optical cutting line formed with line laser light (60).
机译:无需使用编码器或其他设备即可准确测量测量对象的3D形状。三维形状测量装置(10)包括标记搜索单元(104),该标记搜索单元(104)使用搜索标记(40)计算包括形成的光学切割线的测量对象(70)的表面的一部分的坐标带线激光(60)。

著录项

  • 公开/公告号EP3163252A1

    专利类型

  • 公开/公告日2017-05-03

    原文格式PDF

  • 申请/专利权人 OMRON CORPORATION;

    申请/专利号EP20160191643

  • 发明设计人 IIDA TOYOO;

    申请日2016-09-30

  • 分类号G01B11/25;

  • 国家 EP

  • 入库时间 2022-08-21 14:02:52

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