首页> 外国专利> DEFECTIVE PIXEL DETECTION DEVICE, RADIATION DETECTOR, AND DEFECTIVE PIXEL DETECTION METHOD

DEFECTIVE PIXEL DETECTION DEVICE, RADIATION DETECTOR, AND DEFECTIVE PIXEL DETECTION METHOD

机译:缺陷像素检测装置,辐射检测器和缺陷像素检测方法

摘要

PROBLEM TO BE SOLVED: To provide a defective pixel detection device capable of improving detection accuracy of a defective pixel, and a radiation detector and a defective pixel detection method.;SOLUTION: A defective pixel detection device in one embodiment obtains a relationship between the number of a dark image and an output value from a pixel for each of a plurality of pixels based on a plurality of dark images continuously imaged by a detection section having the plurality of pixels, and detects a defective pixel based on behavior of the output value in the relationship obtained.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种能够提高缺陷像素的检测精度的缺陷像素检测装置以及放射线检测器和缺陷像素检测方法。解决方案:一个实施例中的缺陷像素检测装置获得数量之间的关系。基于由具有多个像素的检测部连续成像的多个暗图像,针对多个像素中的每个像素的暗图像的像素的输出值和像素的输出值,并且基于像素的输出值的行为来检测缺陷像素。选择的图纸:图2;版权:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2017188784A

    专利类型

  • 公开/公告日2017-10-12

    原文格式PDF

  • 申请/专利权人 TOSHIBA ELECTRON TUBES & DEVICES CO LTD;

    申请/专利号JP20160076467

  • 发明设计人 TAKI NAOTERU;AIDA HIROYUKI;

    申请日2016-04-06

  • 分类号H04N5/367;H04N5/32;G01T7/00;G01T1/20;

  • 国家 JP

  • 入库时间 2022-08-21 14:01:37

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