首页> 外国专利> TEST AND MEASUREMENT INSTRUMENT AND METHOD OF DETERMINING S-PARAMETER

TEST AND MEASUREMENT INSTRUMENT AND METHOD OF DETERMINING S-PARAMETER

机译:测试参数及测定S参数的方法

摘要

PROBLEM TO BE SOLVED: To improve the measurement of a time domain by a sampling module.SOLUTION: A test and measurement instrument includes: an input unit configured to receive a reflected and/or transmitted pulse signal from a DUT 114; a reference clock input unit configured to receive a reference clock 124, the reference clock being asynchronous from the reflected pulse signal; a phase reference module 122 configured to acquire samples of the reference clock; a sampling module 110 configured to acquire samples of the reflected pulse signal; and a controller 118 configured to determine a S-parameter of the DUT 114 based on the acquired samples of the reference clock 124 and the acquired samples of the reflected pulse signal.SELECTED DRAWING: Figure 1
机译:解决的问题:通过采样模块改善时域的测量。解决方案:测试和测量仪器包括:输入单元,配置为从DUT 114接收反射和/或发射的脉冲信号;参考时钟输入单元,其被配置为接收参考时钟124,该参考时钟与反射脉冲信号异步;相位参考模块122,用于获取参考时钟的采样;采样模块110,被配置为获取反射脉冲信号的采样;控制器118被配置为基于所获取的参考时钟124的样本和所获取的反射脉冲信号的样本来确定DUT 114的S参数。

著录项

  • 公开/公告号JP2017040646A

    专利类型

  • 公开/公告日2017-02-23

    原文格式PDF

  • 申请/专利权人 TEKTRONIX INC;

    申请/专利号JP20160142831

  • 发明设计人 JAN P PEETERS WEEN;

    申请日2016-07-20

  • 分类号G01R27/28;G01R13/20;G01R35;

  • 国家 JP

  • 入库时间 2022-08-21 14:00:40

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号