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DEPOSITION APPARATUS OF COPPER, DEPOSITION METHOD OF COPPER, COPPER WIRING FORMATION METHOD, COPPER WIRING

机译:铜的沉积装置,铜的沉积方法,铜线形成方法,铜线

摘要

PROBLEM TO BE SOLVED: To obtain a semiconductor device using copper wiring inexpensively.;SOLUTION: At a place facing a substrate 100 on the lower side of a deposition chamber 10, a melting pot (CuI vapor production means) 30 is provided. A raw material heater (CuI vapor production means) 31 and a thermocouple 32 are attached to the melting pot 30, and can measure and control the temperature of the melting pot 30. Inside of the melting pot 30 is filled with particles becoming the raw material of copper deposition. This particles are composed of CuI. By heating the melting pot 30 in the vacuum, CuI vapor is produced, and the substrate 100 is exposed to this CuI vapor. By setting the temperature Tsub of the substrate 100 at about 300°C, nothing is deposited on the insulator, and Cu can be deposited only on a conductive metallic material.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2017,JPO&INPIT
机译:解决的问题:为了廉价地获得使用铜布线的半导体器件;解决方案:在沉积室10的下侧的面对衬底100的位置处,提供一个熔炉(CuI蒸气产生装置)30。原料加热器(CuI蒸气产生装置)31和热电偶32安装在熔炉30上,可以测量和控制熔炉30的温度。在熔炉30的内部填充有成为原料的颗粒。铜沉积。该颗粒由CuI组成。通过在真空中加热熔炉30,产生CuI蒸气,并且基板100暴露于该CuI蒸气。通过将基板100的温度T sub 设置为大约300°C,就不会在绝缘体上沉积任何东西,而Cu只能沉积在导电金属材料上。 :(C)2017,JPO&INPIT

著录项

  • 公开/公告号JP2017152628A

    专利类型

  • 公开/公告日2017-08-31

    原文格式PDF

  • 申请/专利权人 IBARAKI UNIV;

    申请/专利号JP20160035760

  • 发明设计人 YAMAUCHI SATOSHI;

    申请日2016-02-26

  • 分类号H01L21/285;H01L21/28;H01L23/532;H01L21/768;H01L21/3205;C23C14/14;C23C14/04;

  • 国家 JP

  • 入库时间 2022-08-21 13:59:03

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