DYNAMIC CHARACTERISTIC TESTING DEVICE AND DYNAMIC CHARACTERISTIC TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To suppress an overcurrent in the case that currents can flow to a reactor in two directions.SOLUTION: A dynamic characteristic testing device 1 comprises a power supply capacitor 11, reactor L, a selection circuit 13 for selecting either one of transistors Qdp and Qdn as an object of switching measurement, and an overcurrent prevention circuit 14 which is connected in parallel with the reactor L to consume energy accumulated in the reactor L. A connection part Cd for connecting the transistors Qdp and Qdn and a connection part Cs for connecting transistors Qhp and Qhn of the selection circuit 13 are connected via the reactor L, and the overcurrent prevention circuit 14 is provided with transistors Qif and Qir and diodes Dif and Dir, and the diode Dif is arranged so that its forward direction is a direction from the connection part Cd to the connection part Cs, and the diode Dir is arranged so that its forward direction is a direction from the connection part Cs to the connection part Cd.SELECTED DRAWING: Figure 1