首页> 外国专利> COATING FILM UNEVENNESS MEASUREMENT METHOD AND COATING FILM UNEVENNESS MEASUREMENT DEVICE

COATING FILM UNEVENNESS MEASUREMENT METHOD AND COATING FILM UNEVENNESS MEASUREMENT DEVICE

机译:涂膜不均匀度的测定方法及涂膜不均匀度的测定装置

摘要

PROBLEM TO BE SOLVED: To provide an image measurement method capable of performing the inspection of coating unevenness generated due to delicate drying conditions perceivable at last by human eyes which has been difficult in the past and an image measurement device.;SOLUTION: A coating film inspection device includes: a transparent substrate 4 having a periodic electrode pattern 3 formed on the surface; an electric power supply 13 for applying a voltage to the electrode pattern; a light source 1 for irradiating light on a coating film 5 coated on the transparent substrate; and an image detector 12 provided with a collimate lens 2 using light from the light source as substantially parallel light and detecting an image of diffraction light generated from the coating film by light irradiation. The coating film is coated on the transparent substrate 4 formed with the periodic electrode pattern on the surface, and the voltage is applied to the electrode pattern 3, and zeroth order diffraction light close to the diffraction angle in which light intensity of a first side lobe becomes zero is detected from among the diffraction light generated when light is irradiated on the coating film 5.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2017,JPO&INPIT
机译:解决的问题:提供一种图像测量方法,该图像测量方法能够执行对由于过去难以观察到的人眼最终感觉到的细微干燥条件而产生的涂层不均匀性的检查;以及图像测量装置。该检查装置包括:透明基板4,在该透明基板4的表面上形成有周期性的电极图案3。用于向电极图案施加电压的电源13;光源1,其在被覆于透明基板上的覆膜5上照射光。图像检测器12具有准直透镜2,该准直透镜2使用来自光源的光作为大致平行的光,并通过光照射来检测从涂膜产生的衍射光的图像。将涂膜涂布在表面上形成有周期性电极图案的透明基板4上,并向电极图案3施加电压,并且使接近于第一旁瓣的光强度的衍射角的零次衍射光施加。从将光照射在涂膜5上时产生的衍射光中,检测到为零。选图:图1;版权:(C)2017,JPO&INPIT

著录项

  • 公开/公告号JP2016200439A

    专利类型

  • 公开/公告日2016-12-01

    原文格式PDF

  • 申请/专利权人 TOPPAN PRINTING CO LTD;

    申请/专利号JP20150079030

  • 发明设计人 YANAGISAWA YASUYUKI;

    申请日2015-04-08

  • 分类号G01N21/88;G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-21 13:56:52

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号