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Scattered radiation correction apparatus, scattered radiation correction method, and X-ray imaging apparatus

机译:散射线校正装置,散射线校正方法和X射线成像装置

摘要

PROBLEM TO BE SOLVED: To provide a scattered radiation correction device capable of directly leading out an image obtained by reducing a scattered radiation component from an image obtained by X-ray imaging, while prohibiting effect of scattered radiation correction from being unnatural.SOLUTION: A scattered radiation correction device according to one aspect of this invention performs scattered radiation correction on a projection image obtained by X-ray imaging, by using a correction function y=f(x), where x is a pixel value of the projection image and y is a pixel value after the scattered radiation correction. The correction function is an inverse function of a function obtained by parallel displacement of a logistic function y=α/[1+exp[-&bgr;(x-γ)]] showing a logistic curve.
机译:解决的问题:提供一种散射放射线校正装置,该装置能够从X射线成像获得的图像中直接导出通过减少散射放射线分量而获得的图像,同时避免散射放射线校正的效果不自然。根据本发明的一个方面的散射辐射校正装置通过使用校正函数y = f(x)对通过X射线成像获得的投影图像执行散射辐射校正,其中x是投影图像的像素值,并且y是散射辐射校正后的像素值。校正函数是通过对数逻辑函数y =α/ [1 + exp [-b(x-γ)]]的平行位移而获得的函数的反函数。

著录项

  • 公开/公告号JP6142289B2

    专利类型

  • 公开/公告日2017-06-07

    原文格式PDF

  • 申请/专利权人 朝日レントゲン工業株式会社;

    申请/专利号JP20130200210

  • 发明设计人 高田 侑弥;

    申请日2013-09-26

  • 分类号A61B6/03;A61B6/14;

  • 国家 JP

  • 入库时间 2022-08-21 13:54:10

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