首页> 外国专利> Liquid composition for cleaning and removing deposits containing copper from the surface of oxide (IGZO) composed of indium, gallium, zinc, and oxygen, IGZO surface cleaning method using the liquid composition, and cleaning method therefor Substrate cleaned by

Liquid composition for cleaning and removing deposits containing copper from the surface of oxide (IGZO) composed of indium, gallium, zinc, and oxygen, IGZO surface cleaning method using the liquid composition, and cleaning method therefor Substrate cleaned by

机译:用于从铟,镓,锌和氧组成的氧化物(IGZO)的表面上清洁和去除包含铜的沉积物的液体组合物,使用该液体组合物的IGZO表面清洁方法及其清洁方法

摘要

The present invention is a liquid composition that cleans and removes copper-containing deposits from the surface of an oxide (IGZO) made of indium, gallium, zinc, and oxygen without corroding the IGZO semiconductor layer and the wiring containing copper. And a method of cleaning the surface of IGZO using the liquid composition, and a substrate cleaned by the cleaning method. In the present invention, a liquid composition containing at least one selected from the group consisting of hydroxycarboxylic acids and dicarboxylic acids or salts thereof and having a pH value of 1.5 to 10 is used.
机译:本发明是一种液体组合物,其从由铟,镓,锌和氧制成的氧化物(IGZO)的表面上清洁并去除含铜沉积物,而不会腐蚀该IGZO半导体层和包含铜的布线。以及使用该液体组合物清洁IGZO的表面的方法以及通过该清洁方法清洁的基板。在本发明中,使用的液体组合物含有选自羟基羧酸和二羧酸或其盐中的至少一种,且其pH值为1.5至10。

著录项

  • 公开/公告号JPWO2015005053A1

    专利类型

  • 公开/公告日2017-03-02

    原文格式PDF

  • 申请/专利权人 三菱瓦斯化学株式会社;

    申请/专利号JP20150526224

  • 发明设计人 玉井 聡;夕部 邦夫;

    申请日2014-06-12

  • 分类号H01L21/304;C11D7/26;C11D7/06;C11D7/32;H01L21/308;

  • 国家 JP

  • 入库时间 2022-08-21 13:53:48

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