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Processing Substrate with Crystal Orientation Mark, Method for Detecting Crystal Orientation and Reading Apparatus for Crystal Orientation Mark

机译:带有晶体取向标记的处理基板,晶体取向的检测方法以及晶体取向标记的读取装置

摘要

To provide a crystal orientation mark which can be formed easily and inexpensively even with a small calibrated substrate, can perform highly accurate alignment and can include information other than crystal orientation.A crystal orientation mark is drawn on a surface of a processed substrate. The crystal orientation mark includes a marking region for crystal orientation detection and a marking region for information. The marking region for crystal orientation detection is provided at two locations on the outer edge portion of the processed substrate and used for alignment of the processed substrate. The information marking region is provided on a linear region connecting two marking regions for crystal orientation detection and includes a pattern for specifying predetermined information related to the processed substrate.
机译:为了提供即使使用小型的校准基板也能够容易且廉价地形成,能够进行高精度的取向,并且能够包含除结晶取向以外的信息的结晶取向标记。在加工后的基板的表面上画有结晶取向标记。晶体取向标记包括用于晶体取向检测的标记区域和用于信息的标记区域。用于晶体取向检测的标记区域设置在处理后的基板的外边缘部分上的两个位置处,并且用于对准处理后的基板。信息标记区域设置在连接两个用于晶体取向检测的标记区域的线性区域上,并且包括用于指定与处理后的基板有关的预定信息的图案。

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