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DEVICE AND METHOD FOR RF EXPOSURE ASSESSMENT AT MILLIMETER WAVE FREQUENCIES

机译:毫米波频率下射频曝光评估的装置和方法

摘要

A device and method for determining power density measurements of electromagnetic (EM) transmissions from an antenna of a wireless electronic device are disclosed. The method can include determining one or more worst case configurations within an exposure plane based on a power density distribution of the antenna in free space. The method can also include measuring power density distribution across a first plane at a first distance from the exposure plane and across a second plane at a second distance from the exposure plane. The method can also include first back transforming power density distribution of the first plane to the second plane, second back transforming power density distribution from the first plane to the exposure plane, and third back transforming power density distribution from the second plane to the exposure plane, for the one or more worst case configurations.
机译:公开了一种用于确定来自无线电子设备的天线的电磁(EM)传输的功率密度测量的设备和方法。该方法可以包括基于天线在自由空间中的功率密度分布来确定暴露平面内的一个或多个最坏情况配置。该方法还可以包括在距曝光平面第一距离的第一平面和距曝光平面第二距离的第二平面上测量功率密度分布。该方法还可以包括:第一平面到第二平面的第一反向变换功率密度分布;从第一平面到曝光平面的第二反向变换功率密度分布;以及第三平面从第二平面到曝光平面的第三反向变换功率密度分布。 ,用于一种或多种最坏情况的配置。

著录项

  • 公开/公告号US2017322247A1

    专利类型

  • 公开/公告日2017-11-09

    原文格式PDF

  • 申请/专利权人 QUALCOMM INCORPORATED;

    申请/专利号US201615348745

  • 发明设计人 LIN LU;JAGADISH NADAKUDUTI;PAUL GUCKIAN;

    申请日2016-11-10

  • 分类号G01R29/08;G01R29/08;

  • 国家 US

  • 入库时间 2022-08-21 13:48:47

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