Design of two-port verification devices for reflection measurement in waveguide vector network analyzers at millimeter and sub-millimeter wave frequencies

摘要

Confidence of vector network analyzer (VNA) measurement can be established by verification process of measurements. The design role of waveguide verification devices has been developed for use at millimeter and sub-millimeter wave frequencies, up to 1.1 THz. Other research groups have also been studied the two port mismatch device for VNA system verification [1–3]. This paper describes design role of verification devices, and then both theoretical estimation and simulation results of verification device characteristics is explained. Furthermore, the measurement results of verification devices are shown in the WM-1651 (WR-6, 110 GHz – 170 GHz) frequency band.