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Apparatus and method for making sputtered films with reduced stress asymmetry

机译:用于制造具有减小的应力不对称性的溅射膜的设备和方法

摘要

Certain example embodiments of this invention relate to techniques for reducing stress asymmetry in sputtered polycrystalline films. In certain example embodiments, sputtering apparatuses that include one or more substantially vertical, non-conductive shield(s) are provided, with such shield(s) helping to reduce the oblique component of sputter material flux, thereby promoting the growth of more symmetrical crystallites. In certain example embodiments, the difference between the travel direction tensile stress and the cross-coater tensile stress of the sputtered film preferably is less than about 15%, more preferably less than about 10%, and still more preferably less than about 5%.
机译:本发明的某些示例实施例涉及用于减少溅射的多晶膜中的应力不对称的技术。在某些示例实施例中,提供了包括一个或多个基本垂直的非导电屏蔽的溅射装置,这种屏蔽有助于减少溅射材料通量的倾斜分量,从而促进更对称的微晶的生长。 。在某些示例实施方式中,溅射膜的行进方向拉应力与跨涂层器拉应力之间的差优选小于约15%,更优选小于约10%,并且还更优选小于约5%。

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