首页> 外国专利> Apparatus and method for monitoring in-band OSNR

Apparatus and method for monitoring in-band OSNR

机译:监测带内OSNR的装置和方法

摘要

An apparatus and a method for monitoring in-band OSNR (Optical Signal-to-Noise Ratio) which monitors the in-band OSNR by using two parallel Mach-Zehnder-interferometers with different optical time delays are disclosed. The apparatus and method can be resistant to chromatic dispersion, polarization mode dispersion and polarized noise, can measure the coherence characteristics of the signal without removing the noise, and can be manufactured into a semiconductor integrated device and be applied in the future high-speed optical network.
机译:公开了一种用于监视带内OSNR(光信噪比)的设备和方法,该设备和方法通过使用两个具有不同光学延迟的并行马赫曾德尔干涉仪来监视带内OSNR。该装置和方法可以抵抗色散,偏振模色散和偏振噪声,可以在不去除噪声的情况下测量信号的相干特性,并且可以被制造为半导体集成器件并且可以在未来的高速光学中应用。网络。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号