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Method for making source and drain regions of a MOSFET with embedded germanium-containing layers having different germanium concentration

机译:制备具有不同锗浓度的嵌入式含锗层的MOSFET的源极和漏极区域的方法

摘要

An integrated circuit structure includes a gate stack over a semiconductor substrate, and an opening extending into the semiconductor substrate, wherein the opening is adjacent to the gate stack. A first silicon germanium region is in the opening, wherein the first silicon germanium region has a first germanium percentage. A second silicon germanium region is over the first silicon germanium region, wherein the second silicon germanium region has a second germanium percentage higher than the first germanium percentage. A third silicon germanium region is over the second silicon germanium region, wherein the third silicon germanium region has a third germanium percentage lower than the second germanium percentage.
机译:一种集成电路结构,包括:半导体衬底上方的栅堆叠;以及延伸到半导体衬底中的开口,其中,该开口与栅堆叠相邻。第一硅锗区域在开口中,其中第一硅锗区域具有第一锗百分比。第二硅锗区域在第一硅锗区域上方,其中第二硅锗区域具有比第一锗百分比高的第二锗百分比。第三硅锗区域在第二硅锗区域上方,其中第三硅锗区域具有比第二锗百分比低的第三锗百分比。

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