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Methods and apparatus for LDMOS devices with cascaded RESURF implants and double buffers

机译:具有级联RESURF注入和双缓冲的LDMOS器件的方法和设备

摘要

LDMOS devices are disclosed. An LDMOS device includes at least one drift region disposed in a portion of a semiconductor substrate; at least one isolation structure at a surface of the semiconductor substrate; a D-well region positioned adjacent a portion of the at least one drift region, and an intersection of the drift region and the D-well region forming a junction between first and second conductivity types; a gate structure disposed over the semiconductor substrate; a source contact region disposed on the surface of the D-well region; a drain contact region disposed adjacent the isolation structure; and a double buffer region comprising a first buried layer lying beneath the D-well region and the drift region and doped to the second conductivity type and a second high voltage deep diffusion layer lying beneath the first buried layer and doped to the first conductivity type. Methods are disclosed.
机译:公开了LDMOS器件。 LDMOS器件包括至少一个设置在半导体衬底的一部分中的漂移区;以及至少一个漂移区。半导体衬底的表面上的至少一个隔离结构; D阱区,位于至少一个漂移区的一部分附近,并且漂移区和D阱区的交点形成第一和第二导电类型之间的结;设置在半导体衬底上方的栅极结构;源极接触区设置在D阱区的表面上;邻近隔离结构设置的漏极接触区;双缓冲区,包括位于D阱区和漂移区下方并掺杂至第二导电类型的第一掩埋层和位于第一掩埋层下方并掺杂至第一导电类型的第二高电压深扩散层。公开了方法。

著录项

  • 公开/公告号US9660074B2

    专利类型

  • 公开/公告日2017-05-23

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号US201514808991

  • 发明设计人 JUN CAI;

    申请日2015-07-24

  • 分类号H01L29/78;H01L29/06;H01L29/10;H01L29/08;H01L21/265;H01L29/66;H01L27/092;H01L21/8238;

  • 国家 US

  • 入库时间 2022-08-21 13:44:23

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