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Magnetic field probe, magnetic field measurement system and magnetic field measurement method

机译:磁场探头,磁场测量系统和磁场测量方法

摘要

A magnetic field probe, a magnetic field measurement system, and a magnetic field measurement method are provided. The magnetic field probe includes a probe head. The probe head includes a first and second inner metal layer. The first inner metal layer includes a first sensing part and a first connecting part coupled thereto. The first sensing part is configured for detecting a magnetic field signal of a device under test to form a first magnetic field distribution signal. The second inner metal layer includes a second sensing part and a second connecting part coupled thereto. The second sensing part is configured for detecting the magnetic field signal of the device under test to form a second magnetic field distribution signal. A distance between the first sensing part and the device under test is smaller than that between the second sensing part and the device under test.
机译:提供了一种磁场探头,磁场测量系统以及磁场测量方法。磁场探头包括探头。探头包括第一和第二内部金属层。第一内部金属层包括第一感测部分和耦接至第一感测部分的第一连接部分。第一感测部分被配置为检测被测设备的磁场信号以形成第一磁场分布信号。第二内部金属层包括第二感测部分和耦接至第二感测部分的第二连接部分。第二感测部分被配置为检测被测设备的磁场信号以形成第二磁场分布信号。第一感测部与被测器件之间的距离小于第二感测部与被测器件之间的距离。

著录项

  • 公开/公告号US9606198B2

    专利类型

  • 公开/公告日2017-03-28

    原文格式PDF

  • 申请/专利权人 NATIONAL TAIWAN UNIVERSITY;

    申请/专利号US201414273558

  • 发明设计人 HSIN-CHIA LU;YIEN-TIEN CHOU;

    申请日2014-05-09

  • 分类号G01R33/02;G01V3/08;G01V3/10;G01R31/20;G01R33/10;G01R33/00;G01R31/315;

  • 国家 US

  • 入库时间 2022-08-21 13:42:39

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