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Near magnetic field probe and the near magnetic field probe unit and near magnetic field probe array and magnetic field measurement system

机译:近磁场探头及近磁场探头单元,近磁场探头阵列及磁场测量系统

摘要

PROBLEM TO BE SOLVED: To reduce measuring errors by preventing, using simple constitution, the interlinkage of a magnetic field from a measured part to the extension wire part of a near magnetic field probe which is brought close to the subject of measurement to detect a magnetic field. ;SOLUTION: In a near magnetic field probe 1, which has on a substrate 2a coil 3 comprising one turn of winding made of a conductive thin film or a plurality of turns of windings with insulating layers between them, an extension wire 4 from the coil 3, and a pad 5 to which the extension wire 4 is connected, the extension wire 4 is provided with a conductive thin film 7 for use as a shield, with an insulating layer 6 between them. Thus, by providing the shield layer made of the conductive thin film 7 on the extension wire 4, errors caused by the interlinkage of magnetic flux to the extension wire are reduced to enable measurements of higher accuracy.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:通过使用简单的结构来防止磁场从附近磁场探头的被测部分到延长线部分的交联,从而减少测量误差,该磁场接近测量对象以检测磁场领域。 ;解决方案:在近磁场探头1中,在基板2a上具有线圈3,该线圈3由导电薄膜制成的一匝绕组或之间具有绝缘层的多匝绕组,从该线圈延伸的导线4如图3所示,在延长线4上连接有焊盘5,在延长线4上设有用作屏蔽的导电性薄膜7,在它们之间具有绝缘层6。因此,通过在延长线4上设置由导电薄膜7制成的屏蔽层,减少了由磁通量与延长线的交链引起的误差,从而能够进行更高的测量精度。版权所有:(C)1998,JPO

著录项

  • 公开/公告号JP3583276B2

    专利类型

  • 公开/公告日2004-11-04

    原文格式PDF

  • 申请/专利权人 株式会社リコー;

    申请/专利号JP19970357793

  • 发明设计人 高 太好;清澤 良行;

    申请日1997-12-25

  • 分类号G01R29/08;G01R33/02;G01R33/10;

  • 国家 JP

  • 入库时间 2022-08-21 23:27:29

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