首页> 外国专利> System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

机译:用于样品的三维预表征的非接触式显微镜的系统和方法,可在纳米探测过程中快速,无损地进行样品导航

摘要

A system for performing sample probing. The system including an topography microscope configured to receive three-dimensional coordinates for a sample based on at least three fiducial marks; receive the sample mounted in a holder; and navigate to at least a location on the sample based on the at least three fiducial marks and the three-dimensional coordinates.
机译:用于执行样品探测的系统。该系统包括地形显微镜,其被配置为基于至少三个基准标记来接收样品的三维坐标;接收安装在支架中的样品;并且基于至少三个基准标记和三维坐标导航到样品上的至少一个位置。

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